Zeiss Sigma VP Field Emission Scanning Electron Microscope (FE-SEM) with Gemini column

This FE-SEM is equipped several detectors for secondary (SE) and backscattered (BSE) electrons. These include in-lens SE, variable pressure SE, Everhart-Thornley SE, BSE, and scanning transmission electron microscopy (STEM) detectors.

Zeiss Sigma VP Field Emission Scanning Electron Microscope (FE-SEM) with Gemini column